Conference presentation

C. Uyemura & Co., Ltd. has presented at the following academic conference.

TitleThe Effect of Ni Content in Electroless Cu Deposit on the Adhesion Between the Seed Layer and Glass Substrate
SpeakerKanji Matsumoto
Dates Sep.28(Mon), 2026 - Oct.01(Thu), 2026
OrganaizerInternational Microelectronics Assembly & Packaging Society
ConferenceIMAPS

Back to index