{"id":9326,"date":"2024-10-04T15:24:54","date_gmt":"2024-10-04T06:24:54","guid":{"rendered":"https:\/\/www.uyemura.co.jp\/?post_type=information&p=9326"},"modified":"2024-10-04T15:24:54","modified_gmt":"2024-10-04T06:24:54","slug":"investigation-of-the-effects-of-various-factors-within-steps-of-sap-process-to-nanovoids-in-the-interface-between-electroless-copper-layer-and-inner-layer-copper-by-stem-analysis","status":"publish","type":"information","link":"https:\/\/www.uyemura.co.jp\/en\/development\/information\/conferences\/9326\/","title":{"rendered":"Investigation of the effects of various factors within steps of SAP process to nanovoids in the interface between electroless copper layer and inner layer copper by STEM analysis"},"content":{"rendered":"","protected":false},"featured_media":0,"template":"","information_tax":[14],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.uyemura.co.jp\/wp-json\/wp\/v2\/information\/9326"}],"collection":[{"href":"https:\/\/www.uyemura.co.jp\/wp-json\/wp\/v2\/information"}],"about":[{"href":"https:\/\/www.uyemura.co.jp\/wp-json\/wp\/v2\/types\/information"}],"wp:attachment":[{"href":"https:\/\/www.uyemura.co.jp\/wp-json\/wp\/v2\/media?parent=9326"}],"wp:term":[{"taxonomy":"information_tax","embeddable":true,"href":"https:\/\/www.uyemura.co.jp\/wp-json\/wp\/v2\/information_tax?post=9326"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}